Blast Yield

Blast Yield™ is a unique DFM and DFY solution for IC designs at 90 nms and below. Blast Yield integrates comprehensive manufacturability and yield enhancement technology into Magma’s advanced RTL-to-GDSII implementation flow. With Blast Yield, designers can improve manufacturability and yield while concurrently optimizing timing, area, power and noise.

Enables manufacturability and yield improvement throughout the RTL-to-GDSII implementation flow.
Provides a comprehensive solution for the improvement of cell yield and wire yield in the design.
Uses yield-aware technology mapping and cell sizing to optimize functional cell yield.
Generates user-friendly yield reports through embedded yield analysis.
Includes concurrent optimization of yield, timing, area, power and signal integrity, ensuring optimum performance and improved yield.
Uses critical area analysis (CAA) and CAA-driven wire spreading to lower failure probability.
Fast, accurate OPC simulation drives routing decisions to ensure an OPC-friendly design.
Supports advanced manufacturability rules.