Yield Management and Failure Analysis

Industry-standard CAD navigation software for failure analysis and yield management

As process geometries shrink and manufacturing costs increase, identifying the root cause of yield loss becomes even more critical. Advanced CAD navigation and yield management software is required to collect, analyze and debug data from EDA tools, test tools and lab/fab tools. By feeding these results back into the design phase defects can be corrected before they affect manufacturing, improving time to yield and market.

Magma’s yield management and failure analysis products include:

Knights Camelot imports CAD design data from all the key LVS packages and several user-proprietary formats and provides visual representations of circuits, converts layout, netlist, and schematic data, and establishes crossmapping links between each data entity. By allowing failure analysis engineers to collect, analyze and share this information with designers, Knights Camelot allows closer collaboration between product and design groups with failure analysis labs and improves time to yield and market.
Knights Merlin’s Framework is a proven CAD navigation software solution that connects failure analysis equipment to design layout and inspection data allowing designers to inspect, probe or cut the suspected failure.
Knights YieldManager combines high-level correlations of disparate data sources with the rapid drill-down of data scope to expedite identification of the root causes of yield loss, saving engineering time and focusing resources.
Knights LogicMap is the industry’s first commercially available software solution for correlating inline defects with failed nets in a logic device.
Knights Smart Sampling™ automates inline defect sampling of wafer inspection data in conjunction with inline review tools within the semiconductor manufacturing environment. Smart Sampling accurately determines which tool type is best suited to review and classify particular defects, improving utilization of inline review tools.